Surface and Thin Film Analysis. A Compendium of Principles, Instrumentation, and Applications

This new book has been revised and updated and is divided into four parts – electron, ion, and photon detection, as well as scanning probe microscopy. New chapters have been added to cover such techniques as SNOM, FIM, atom probe (AP),and sum frequency generation (SFG). Appendices with a summary and comparison of techniques and a list of equipment suppliers make this book a rapid reference for materials scientists, analytical chemists, and those working in the biotechnological industry. From a Review of the First Edition (edited by Bubert and Jenett) «… a useful resource…» (Journal of the American Chemical Society)

На нашем сайте можно скачать книгу "Surface and Thin Film Analysis. A Compendium of Principles, Instrumentation, and Applications" в формате pdf или читать онлайн. Здесь так же можно перед прочтением обратиться к отзывам читателей, уже знакомых с книгой, и узнать их мнение. В интернет-магазине нашего партнера вы можете купить и прочитать книгу в бумажном варианте.